Oμιλία-"Intensional Associations Between Data and Metadata"

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Oμιλία-"Intensional Associations Between Data and Metadata"

Post by Ethel » Tue Mar 04, 2008 2:50 pm

Έτσι για να βλέπουμε και τι δουλειές γίνονται σε ξένα πανεπιστήμια... ;)
Ομιλία με θέμα "Intensional Associations Between Data and Metadata"
Yannis Velegrakis, University of Trento

Τετάρτη 05/03/2008, 12:00-13:00, Πτέρυγα Αντωνιάδου, Αίθουσα Α41.

Abstract: There is a growing need to associate a variety of metadata with the underlying data, but a simple, elegant approach to uniformly model and query both the data and the metadata has been elusive.
In this paper, we argue that (1) the relational model augmented with queries as data values is a natural way to uniformly model data, arbitrary metadata and their associations, and (2) relational queries with a join mechanism augmented to permit matching of query result relations, instead of only atomic values, is an elegant way to uniformly query across data and metadata.
We describe the architecture of a system we have prototyped for this purpose, demonstrate the generality of our approach and evaluate the performance of the system, in comparison with previous proposals for metadata management. This is a join work with Divesh Srivastava from AT&T Research labs. It was presented in the last SIGMOD and the system was demonstrated in ICDE of the same year.

Short Bio: Yannis Velegrakis is a faculty member of the Department of Information Engineering and Computer Science of the University of Trento. His research area of expertise includes schema and ontology mapping, interoperability, information integration, data exchange, view updates, view maintenance and meta-data management.
Prior to joining the University of Trento, he held a researcher position at AT&T Research Labs in the US. He has also spent time as a visitor at the University of California, Santa-Cruz, the IBM Almaden Research Center, and the Center of Advanced Studies of the IBM Toronto Lab. He was a member of the committee for the CIMI cultural profile of the ANSI/NISO Z39.50 standard. He has served in program committees of many international conferences.
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